Quality Inspection for Silica Window - Co:Spinel Crystals – Dien
Quality Inspection for Silica Window - Co:Spinel Crystals – Dien Detail:
Passive Q-switches or saturable absorbers generate high power laser pulses without the use of electro-optic Q-switches, thereby reducing the package size and eliminating a high voltage power supply. Co2+:MgAl2O4 is a relatively new material for passive Q-switching in lasers emitting from 1.2 to 1.6μm, in particular, for eye-safe 1.54μm Er:glass laser, but also works at 1.44μm and 1.34μm laser wavelengths. Spinel is a hard, stable crystal that polishes well. Cobalt substitutes readily for magnesium in the Spinel host without the need for additional charge compensation ions. High absorption cross section (3.5×10-19 cm2) permits Q-switching of Er:glass laser without intracavity focusing both with flash-lamp and diode laser pumping. Negligible excited-state absorption results in high contrast ratio of Q-switch, i.e. the ratio of initial (small signal) to saturated absorption is higher than 10.
• Suitable for 1540 nm eye-safe lasers
• High absorption section
• Negligible excited state absorption
• High optical quality
• Uniformly distributed Co
• Eye-safe 1540 nm Er:glass laser
• 1440 nm laser
• 1340 nm laser
• Eye-safe laser range finder
| Chemical formula | Co2+:MgAl2O4 |
| Crystal structure | Cubic |
| Lattice parameters | 8.07Å |
| Density | 3.62 g/cm3 |
| Melting Point | 2105°C |
| Refractive Index | n=1.6948 @1.54 µm |
| Thermal Conductivity /(W·cm-1·K-1@25°C) | 0.033W |
| Specific Heat/ (J·g-1·K-1) | 1.046 |
| Thermal Expansion /（10-6 /°C@25°C ） | 5.9 |
| Hardness (Mohs) | 8.2 |
| Extinction Ratio | 25dB |
| Orientation | [100] or [111] < ±0.5° |
| Optical density | 0.1-0.9 |
| Damage Threshold | >500 MW/cm2 |
| Doping concentration of Co2+ | 0.01-0.3 atm% |
| Absorption coefficient | 0 ～ 7 cm-1 |
| Working wavelength | 1200 – 1600 nm |
| Coatings | AR/AR@1540，R<0.2%; AR/AR@1340，R<0.2% |
| Orientation Tolerence | < 0.5° |
| Thickness/Diameter Tolerance | ±0.05 mm |
| Surface Flatness | <λ/8@632 nm |
| Wavefront Distortion | <λ/4@632 nm |
| Surface Quality | 10/5 |
| Parallel | 10〞 |
| Perpendicular | 5ˊ |
| Clear Aperture | >90% |
| Chamfer | <0.1×45° |
| Maximum dimensions | Dia(3-15)×(3-50)mm |
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By Quintina from Florida - 2017.04.08 14:55
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By Christopher Mabey from Honduras - 2018.06.21 17:11
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